X-RAY FLUORESCENCE SPECTROMETER WITH WAVE-LENGTH DISPERSION
Fluorescence X-ray analysis (XRF) is an analytical method that measures the emission of the characteristic “secondary” (or fluorescent) X-rays from a sample excited by exposure to X-rays. This phenomenon is widely used in elemental analysis and chemical analysis. The device enables the testing of liquid and solid samples without mineralization. Measures elements ranging from sodium to uranium in concentrations from 50 ppm to 100%.
In our laboratory, it is one of the basic research devices. virtually any sample of unknown composition first goes to an XRF test to determine its elemental composition. We use it especially in the research of metals, glass, ceramics, fuels and building materials, as well as in geochemical, forensic and archaeological research.